Abstracts and Speakers' Biographies
Moderator: Gerry Turcotte, former Communications Research Centre Canada President
Biography
J.G. (Gerry) Turcotte was born in Ottawa, has been married for 45 years, and has five children and seven grandchildren. He graduated from Royal Military College in 1961, and obtained his B.Eng. Degree in Electrical Engineering from McGill University in 1962. He was awarded an Honorary Doctorate of Engineering by Carleton University in 1998. He was named an Ottawa Technology All Star in 1997. He spent his working life: in military, as an active officer of the Royal Canadian Navy (1957 – 1965); in industry, as an Engineer at Computing Devices (1965 – 1974); in Academia, as Department Head, Algonquin College (1974 – 1984); in research consortia, as President of Ottawa-Carleton Research Institute (1984 –1996); and in research lab, as President of Communications Research Centre Canada (1996 – 2004). Since 2004, Mr. Turcotte has been serving as a gentleman farmer. He has also served as a member on several boards.
Biography
Dr. James W. (Jim) McLaren is the Director General of the Institute for National Measurement Standards (INMS) of the National Research Council of Canada (NRC). He joined NRC as a Research Associate in 1976, shortly after completion of his Ph.D. in analytical chemistry at Queen's University, Kingston, Ontario. His research interests at NRC focussed on development and characterization of instrumentation for inductively coupled plasma atomic emission spectrometry (ICPAES) and inductively coupled plasma mass spectrometry (ICPMS), with a particular interest in application of these two techniques to the determination of trace elements in environmental samples including both fresh and saline natural waters, marine sediments and biological tissues. McLaren's contributions to the development of ICPMS were recognized by the Canadian Society for Chemistry in 1988 with the award of the W.A.E. McBryde Medal for Analytical Chemistry, and by the Spectroscopy Society of Canada in 1994 with the Barringer Spectroscopy Award.
From 1995 until 2000, McLaren served as Group Leader for Chemical Metrology in INMS. Many of the activities of this group are aimed to assist analytical laboratories in both the public and private sectors in assuring the accuracy of determinations of inorganic and organic contaminants in environmental samples. These activities include the development of reliable methodologies, the provision of certified reference materials and the co-ordination of laboratory proficiency testing exercises. He also became increasingly active in international metrology activities that are co-ordinated under the auspices of the International Committee of Weights and Measures.
Dr. McLaren acquired a broader knowledge of NRC during a 2-year period from 1997-1999, when he served as Leader of the NRC Competency Project, the objective of which was to implement competency-based human resources management at NRC. He is currently a member of the Human Resources Management Steering Committee, which serves as an advisory board to the Human Resources Branch.
Dr. McLaren was appointed INMS Director, Chemical and Mechanical Standards in January 2000, assuming responsibility for INMS activities in chemical metrology, dimensional metrology, mass standards, acoustical standards and time and frequency metrology. Following a re-organization of INMS in late 2004, he successfully competed for his current position.
Keynote Address: Intelligent Sensor Agents for Infrastructure and Environment Monitoring – Challenges, by Dr. Emil Petriu, Acting Dean, Faculty of Engineering, University of Ottawa
Abstract
Monitoring environment and infrastructure state-parameters is a task of great importance in many areas such as the natural environments, industrial or laboratory hazardous environments, polluted natural environments, water treatment plants, nuclear stations, war zones, or for detecting infrastructure failures and for updating simulations of critical infrastructure failure interdependencies during failure events. This presentation discusses development aspects of a network of intelligent autonomous Robotic Sensor Agents deployed in the field for active investigation of complex environmental parameters.
Biography
Emil M. Petriu, Fellow IEEE, is a Professor and University Research Chair in the School of Information Technology and Engineering (SITE), University of Ottawa, Ottawa, Ontario, Canada.
He has published 68 refereed journal papers, over 150 papers in refereed conference proceedings, authored two books, edited two books, and received two patents.
Emil Petriu was a member of the Administrative Committee (1996-2005) and Vice President (2000-2002) of the IEEE Instrumentation and Measurement Society. He is currently serving as Chair of the TC-15 on Virtual Systems, Co-Chair of the TC-28 Instrumentation and Measurement for Robotics and Automation, Co-Chair of the TC-30 Security and Contraband Detection of the IEEE Instrumentation and Measurement Society. He received the 2003 IEEE Instrumentation and Measurement Society Award "for outstanding contributions to the theory and practice of robot sensing and perception." He was a co-recipient of the prestigious 2003 IEEE Donald G. Fink Prize Paper Award, the unique paper award presented by IEEE in that year.
Abstract
The test and measurement industry is a key enabler for the design and manufacturing of high-tech electronic products. Agilent Technologies has been the premier supplier of test and measurement products for over 60 years. Larry Desjardin of Agilent Technologies will give an overview of the test and measurement industry today, key applications and trends, and the challenges and direction of test and measurement in the future. The discussion will cover the breadth of test and measurement, how test is being applied to cost-sensitive product development and manufacturing, and how instrumentation will change to meet new emerging requirements. Many of the topics touched on will be further explored in the subsequent discussions within the workshop.
Biography
Mr. DesJardin holds B.Sc. Degree in Engineering from the California Institute of Technology, and M.Sc. degree in Electrical Engineering from Stanford University. He holds two patents: one for ultra-precision analog-to-digital converter technology, and another on precision AC voltage measurement techniques.
Embedded Testing of VLSI/Systems on a Chip (SoC), by Jeff Rearick, Scientist, Agilent Technologies, Fort Collins, CO
Abstract
As the operating frequencies of digital integrated circuits continue to rise while the power supply voltages and signal swings continue to fall, common notions of designing and testing digital chips are being challenged. One aspect of this new situation is that while traditional digital chip testing is still necessary, it is not sufficient to assure acceptable quality levels. Indeed, many circuit design marginalities and IC process defects manifest themselves in the analog realm and must be dealt with there rather than with digital methods.
This presentation briefly reviews digital testing, then explores several problems with these techniques that are forcing analog test concepts to be employed. Special attention is paid to the complexity of at-speed testing in general and high-speed serial I/O testing in particular. Some possible directions for both off-chip and on-chip test hardware and methods are surveyed, and some recent results from the lab are presented.
Biography
Jeff Rearick joined Hewlett Packard in 1984 after earning his BSEE from Purdue University, Lafayette, IN. His early work on generating manufacturing tests for large digital chips led him toward the R&D lab and into the CAD tools group to work on design and test automation software. During this time, Mr. Rearick received an HP Fellowship to attend the University of Illinois, Urbana-Champaign, IL, at which he earned his MSEE in 1993. He returned to continue his test work by focusing on Design-For-Test methodologies and circuits for HP Precision Architecture processors and support chips, for which he has earned over 20 patents and many publications. Since being spun-off from HP into Agilent Technologies, Mr. Rearick has continued his test work on large high-performance ASICs, leading to recent work on high-speed I/O testing (some of which became IEEE Stardard 1149.6, for which he served on the working group) as well as embedded analog instrumentation.
Optical Heterodyne Instruments in Optical Communications, by Dr. Bogdan Szafraniec, Agilent Technologies, Palo Alto, CA
Abstract
Electrical spectrum analyzers and network analyzers are commonly used by circuit designers. These basic instruments are not easily realizable in the optical world where frequencies are higher by many orders of magnitude. However, the introduction of swept, mode-hop-free laser technology helped to enable the first coherent optical instruments, whose operation has many similarities to its electrical predecessors. Still, there are many challenges related to high optical frequencies, and the additional degrees of freedom hidden in the polarization state of the optical field. The advances in measurement capability and the challenges of coherent optical instrument design are subjects of this talk.
Biography
Bogdan Szafraniec received his M.S. and Ph.D. degrees in Electrical Engineering from the Illinois Institute of Technology. He has done pioneering research in the area of coherent optical measurements, which contributed directly to revolutionary new instruments for optical spectrum and component analysis. He played a key role in the development of depolarized fiber optic gyros at Honeywell. In 1999, he joined the Measurement Research Laboratory of Agilent Laboratories where he is an expert researcher investigating technology for new optical test instruments. His research is focused on optical heterodyne instruments that use swept local oscillators and coherent detection.
Microwave Antenna Measurements at CRC, by David Lee, Advanced Antenna Technology Research Group, Communications Research Centre of Canada
Abstract
The Communications Research Centre Canada (CRC) is the leading federal laboratory for research and development (R&D) in advanced telecommunications. An agency of Industry Canada, CRC focuses on the technologies that form our nation’s basic communications - radio, satellite, broadcasting and fibre optics. Within these key areas, CRC works in collaboration with public, private and academic sectors, both in Canada and abroad, responding to the federal government’s goal to increase Canada’s innovation capacity and to make communications technologies available to all Canadians.
Within CRC, the Terrestrial Wireless Systems (TWS) Branch advances the understanding of and develops the concepts and technologies for fixed mobile and personal wireless communications systems. The demands of mobility and wireless high-speed multi-media access to the Internet have created significant developments in this important sector of the wireless industry. TWS interacts extensively with Canadian industry and academia as well as other national and international research organizations. Research results provide needed information and advice to National Defence in the Defence Research Program, to Industry Canada in support of spectrum management and ICT, and to private industry in the form of technology transfer, collaborations, and contractual arrangements.
As part of TWS, Research-Advance Antenna Technology (RAAT) group explores novel antenna concepts and develops state–of–the–art antennas and design techniques for advanced communication systems. The research includes low–profile antennas to active and passive antenna arrays and the design frequencies cover from 800 MHz to 100 GHz. To support the antenna research, in 1994, CRC has established an Antenna Measurement Laboratory (RAATLab), which provides high-speed, high accuracy antenna measurements to validate research and prototype designs in a cost effective and efficient manner. Measurement errors are analyzed and controlled to permit accurate evaluation of antenna parameters such as radiation patterns, gain, sidelobes levels, and crosspolar levels. RAATLab facilities include: an indoor far-field range, two planar near-field ranges, a compact test range (under development) and a quasi-optic (open-guide) test bed. The presentation will briefly illustrate the different facilities, their capabilities and their merits. It will then provide a look to antenna measurement theory, procedures, systems, and achievable accuracies for the most common antenna measurement techniques in use today.
Biography
David Lee graduated from Algonquin College in Electrical Engineering Technology, Ottawa, Ontario, Canada. From 1981-2000, he was RF group leader responsible for passive and active microwave antenna measurements in the David Florida Laboratory at the Canadian Space Agency. This activity included satellite payload testing, scale modeling investigations and the development of a uniquely Canadian spherical near-field measurement system with CAL Corporation. He also helped established the far-field chamber at the Royal Military College in Kingston Ontario. He joined the Communications Research Centre in 2000 as the Head of the Antenna Test Facility, in the Advanced Antenna Technology Group, doing research on antennas and developing accurate measurement technologies, calibration procedures, and error analysis for both the far field and near field ranges, as well as providing support to the Defense Research & Development Canada's near-field test facilities. He is currently establishing a new compact range facility capable of 2 - 100 GHz measurements. His research interest includes novel low cost antennas for wireless and other antenna designs. He assists graduate students at various universities with antenna prototype development and testing, and is a co-inventor on a patent for an ultra-wideband antenna.
Fast and Selective Detection of Chemical and Biological Agents using Ion Mobility and Mass Spectrometry, by Dr. Zoltan Mester, Institute for National Measurement Standards, NRC
Abstract
Following a chemical/biochemical terrorist attack, an analytical system that can screen samples and provide results in minutes rather than days or weeks is essential to rapidly assess and mitigate health, economic and environmental impacts.
Here we describe the development of the high Field Asymmetric waveform Ion Mobility Spectrometry (FAIMS) mass spectrometry (MS) - based technology for rapid and highly sensitive detectioJ.G. (Gerry) Turcotte was born in Ottawa, has been married for 45 years, and has five children and seven grandchildren. He graduated from Royal Military CJ.G. (Gerry) Turcotte was born in Ottawa, has been married for 45 years, and has five children and seven grandchildren. He graduated from Royal Military College in 1961, and obtained his B.Eng. Degree in Electrical Engineering from McGill University in 1962. He was awarded an Honorary Doctorate of Engineering by Carleton University in 1998. He was named the Ottawa Technology All Star in 1997. He spent his working life: in military, as an active officer of the Royal Canadian Navy (1957 – 1965); in industry, as an Engineer at Computing Devices (1965 – 1974); in Academia, as Department Head, Algonquin College (1974 – 1984); in research consortia, as President of Ottawa-Carleton Research Institute (1984 –1996); and in research lab, as President of Communications Research Centre Canada (1996 – 2004). Since 2004, Mr. Turcotte has been serving as a gentleman farmer, and as a member on boards of several corporations.ollege in 1961, and obtained his B.Eng. Degree in Electrical Engineering from McGill University in 1962. He was awarded an Honorary Doctorate of Engineering by Carleton University in 1998. He was named the Ottawa Technology All Star in 1997. He spent his working life: in military, as an active officer of the Royal Canadian Navy (1957 – 1965); in industry, as an Engineer at Computing Devices (1965 – 1974); in Academia, as Department Head, Algonquin College (1974 – 1984); in research consortia, as President of Ottawa-Carleton Research Institute (1984 –1996); and in research lab, as President of Communications Research Centre Canada (1996 – 2004). Since 2004, Mr. Turcotte has been serving as a gentleman farmer, and as a member on boards of several corporations.n of chemical warfare agents, toxic agrochemicals, and biotoxins.
High Field Asymmetric waveform Ion Mobility Spectrometry (FAIMS) is a novel continuous chemical separation method. The separation of ions in FAIMS results from differences in ion mobility in strong and weak electric fields.
Biography
Zoltan Mester obtained his Ph.D. in chemistry in 1998 from Corvinus University in Budapest, Hungary. He joined NRC INMS in 1999. His research interests are in the development of mass spectrometry based detection methods for trace organic and inorganic compounds. Dr. Mester published over 70 peer reviewed papers and presented many invited lectures at scientific conferences.
LXI Interface Standard / Synthetic Instruments, by Grant Drenkow, Solution Planner, System Components, Agilent Technologies, Loveland, CO
Abstract
LXI: The Future of Test In November of 2005, a new test instrument architecture standard called LAN Extensions for Instruments (LXI) was introduced. Forty of the leading T&M companies world-wide are part of the LXI Consortium. LXI is an instrument architecture that promises to make instrument designs more versatile and make software more transportable across the product life cycle. LXI is based on existing hardware and software standards; making it a natural fit in the Agilent Open test environment. This presentation describes LXI and its benefits, offers a number of tools and hints to help accelerate the test system integration, and illustrates ways one can use LXI in an existing test system.
Biography
Grant is a solution planner for Agilent Technologies' System Component Team. His role includes researching and planning for Agilent's future LXI products. He joined Hewlett-Packard in 1983 and has performed various marketing roles in Product Marketing, Application Engineering, Sales Development, and Product Marketing. He has also spent 4 years in Europe as a Product Line Manager. He holds a BS in Electrical Engineeringand an MBA in Marketing.
Military Applications of High Performance Data Acquisition and Signal Processing Systems, by Robert Inkol, Defense Research and Development Canada, Ottawa
Abstract
High performance Components off the Shelf (COTS) analog-to-digital converter subsystems, combined with high performance personal computer technology, permit the cost-effective software-based implementation of sophisticated real-time signal processing systems. Such systems are potentially capable of performing a wide range of functions that formerly required costly hardware, such, as signal analyzers and spectrum monitoring. However, practical experience has shown that performance can be severely degraded if care is not taken in the design and implementation. This talk will provide an overview of how the available hardware/software infrastructure is applicable to high performance signal processing applications. Practical issues affecting achievable performance parameters such as dynamic range and sustained bandwidth will be discussed.
Biography
Robert Inkol received his B.Sc. and M.A.Sc. Degrees in Applied Physics and Electrical Engineering from the University of Waterloo in 1976 and 1978, respectively. Since 1978 he has been with the Defence Research and Development Canada (DRDC) where he is currently a senior scientist. He has made contributions to the application of very large scale integrated circuit technology and digital signal processing techniques to electronic warfare systems. He is an adjunct professor with the Royal Military College, in Kingston, Ontario, and is a Senior Member of the IEEE.
